Ключевые слова: HTS, REBCO, coated conductors, tapes, coils, cooling technology, damage mechanisms, critical current, impregnation, mechanical properties, thickness dependence, modeling
Ambrosio G., Ferracin P., Schmalzle J., Devred A., Baldini M., Todesco E., Sgobba S., Milanese A., Bermudez S.I., Santillana I.A., Vallone G., Troitino J.F., Crouvizier M.D., Moros A., Lusa N.
Ключевые слова: accelerator magnets, LTS, Nb3Sn, coils, quench protection, fabrication, magnets quadrupole, design, crack formation, measurement technique, damage mechanisms
Eisterer M., Speller S.C., Grovenor C.R., Fischer D., He G., Iliffe W., Adams K., Nicholls R.J., Diaz-Moreno S., Mosselmans F.
Ключевые слова: LTS, Nb3Sn, cables, helical winding, mechanical properties, fatigue behavior, damage mechanisms, cryogenic systems, nitrogen liquid
Ключевые слова: HTS, REBCO, coated conductors, tapes, interfaces, damage mechanisms, review
Ключевые слова: HTS, YBCO, tapes, irradiation effects, neutron irradiation, lattice parameter, defects, oxygen diffusion, modeling, numerical analysis, damage mechanisms
Ключевые слова: LTS, Nb3Sn, strands, wires, filaments, fracture behavior, mechanical properties, elastic behavior, thermal stress, tensile tests, numerical analysis, damage mechanisms
Ключевые слова: HTS, YBCO, tapes, dc performance, mechanical properties, measurement technique, delamination, damage mechanisms
Dergunova E.A., Mareev K.A., Abdyukhanov I.M., Nasibulin M.N., Polikarpova M.V., Alekseev M.V., Tsapleva A.S., Luk’yanov P.A., Zakharova G.A., Panashchuk I.A.
Ключевые слова: LTS, Nb3Sn, cables, bronze process, internal tin method, defects, critical current, microstructure, damage mechanisms
Ключевые слова: HTS, YBCO, coated conductors, tapes, neutron irradiation, irradiation effects, microstructure, experimental results, damage mechanisms
Ключевые слова: HTS, YBCO, coated conductors, mechanical properties, interfaces, defects, modeling, numerical analysis, stress effects, strain effects, bending process, damage mechanisms
Ключевые слова: HTS, DI-Bi2223/Ag, wires, impregnation, hot spots, coils pancake, quench protection, design parameters, critical current, experimental results, damage mechanisms
Senatore C., Verweij A., Siemko A., Will A., Schmidt R., Wollmann D., Bonura M., Mentink M., Raginel V., Kleiven D., Kulesz K.
Ключевые слова: HTS, YBCO, coated conductors, coils, impregnation, hot spots, quench protection, design parameters, experimental results, deformation, damage mechanisms
Ключевые слова: NMR magnet, quench protection, training effect, LTS, NbTi, damage mechanisms
Ключевые слова: ITER, LTS, Nb3Sn, cable-in-conduit conductor, test results, SULTAN, twist-pitch, microstructure, damage mechanisms
Ключевые слова: MgB2/Nb/Cu, MgB2/Nb/Monel, wires multifilamentary, resistance, defects, barriers, microstructure, resistive transition, experimental results, new, damage mechanisms
Ключевые слова: HTS, YBCO, coated conductors, coils, insulation coating, mechanical properties, stress effects, experimental results, damage mechanisms
Ключевые слова: LHC, numerical analysis, mechanical properties, displacements, modeling, damage mechanisms
Osamura K., Hojo M., Sugano M., Wada H., Itoh K., Kitaguchi H., Kumakura H., Ochiai S., Kuroda T., Okuda H.
Ключевые слова: HTS, Bi2223, tapes, n-value, critical caracteristics, critical current, mechanical properties, bending process, experimental results, damage mechanisms
Ключевые слова: HTS, Bi2212, filaments, irradiation effects, resistivity, experimental results, damage mechanisms
Ключевые слова: LTS, Nb3Sn, strands, fabrication, bronze process, stiffness, modeling, numerical analysis, degradation studies, damage mechanisms
Ключевые слова: HTS, YBCO, coated conductors, measurement technique, critical current density, damage mechanisms
Ключевые слова: MgB2, LTS, Nb3Ga, Nb3Sn, V3Si, irradiation effects, comparison, experimental results, damage mechanisms
Oh S.S., Ha D.W., Okuda H., Ochiai S.(ochiai@iic.kyoto-u.ac.jp), Fujimoto M.
Osamura K., Hojo M., Sugano M., Matsuoka T., Okuda H., Ochiai S.(ochiai@iic.kyoto-u.ac.jp), Shin J.K.
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